Vol. 14, Special Issue 2: 9th EARSeL Imaging Spectroscopy Workshop, 71-90, 2015-16 |
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Evaluation of leaf area index and dry matter predictions for crop growth modelling and yield estimation based on field reflectance measurements
Heike Gerighausen, Holger Lilienthal, Thomas Jarmer, and Bastian Siegmann
Abstract R2 of the global PLSR models based on continuous field reflectance measurements and independent validation varied from 0.74 to 0.79 (LAI), and from 0.76 to 0.87 (DM). Root mean square error ranged between 0.70 and 0.74 m2 m-2, and between 1.64 and 2.56 t ha-1, respectively. There was no pre-processing method which consistently improved model performance. However, results pointed out that the technique should be chosen with respect to the sensor and the parameter of interest. Models based on hyperspectral information performed generally best. Prediction error increased with the superspectral sensor configuration by only 3% for LAI, and 16% for DM. Multispectral sensor configurations caused the prediction error to rise by up to 22% and 54%, respectively. A stratification into local data sets according to date of acquisition, sampling region and crop type partially increased the prediction performance. Cross-validation yielded higher prediction errors than independent validation in most cases. | |||||||||||||||||||||||
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DOI:
10.12760/02-2015-2-06 History Submitted: 10 Aug 2015 Revised: 8 Apr 2016 Accepted: 30 May 2016 Published: 14 June 2016 Responsible editor: Miriam Machwitz Citation Gerighausen H, H Lilienthal, T Jarmer & B Siegmann, 2016. Evaluation of leaf area index and dry matter predictions for crop growth modelling and yield estimation based on field reflectance measurements. EARSeL eProceedings, 14(S2): 71-90 |
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ISSN 1729-3782 |