About the use of reflectance terminology in imaging spectroscopy
Gabriela Schaepman-Strub, Michael Schaepman, Stefan Dangel, Thomas Painter and John Martonchik
Abstract
Analysing
databases, field and airborne spectrometer data, modelling studies and publications,
a lack of consistency in the use of definitions and terminology of reflectance
quantities can be observed. One example is the term ‘BRDF’ (bidirectional
reflectance distribution function) assigned to significantly differing
quantities, ranging from the bidirectional reflectance distribution function to
hemispherical-conical reflectance factors. Our contribution summarizes basic
reflectance nomenclature articles. Secondly differences of reflectance products
are quantified, with special emphasis on wavelength specific effects, to stress
the importance of adequate usage of reflectance definitions and quantities. Results
from the comparison of directional-hemispherical reflectance versus
bihemispherical reflectance and bidirectional reflectance factors versus
hemispherical-directional reflectance factors are shown. Differences of these
quantities are exemplified using modelling results of a black spruce forest
canopy, snow cover, as well as an artificial target. The actual differences in
the reflectance products of a remotely sensed surface depend on the atmospheric
conditions, the surroundings, topography, and the scattering properties of the
surface itself. As these effects are highly wavelength-dependent, the imaging
spectroscopy community has to become more specific on the application and
definition of reflectance quantities. As of today most delivered reflectance
products from imaging spectrometers include the hemispherical illumination
component. Thus, product algorithms based on surface reflectance data have to include
the actual atmospheric conditions even for nadir view angles, e.g., in the form
of a wavelength-specific indication of the ratio of diffuse to direct
illumination. The results urge the community to treat reflectance quantities
with outmost care and consistency to reduce uncertainties of derived products.
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History
Submitted: 26 May 2005
Revised: 25 Aug 2005
Accepted: 21 Oct 2005
Citation
Schaepman-Strub G, M Schaepman, S Dangel, T Painter & J Martonchik, 2005. About the use of reflectance terminology in imaging spectroscopy.
EARSeL eProceedings, 4(2), 191-202
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ISSN 1729-3782
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